User:John R. Brews/WP Import: Difference between revisions

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==BJT parameters==
==BJT parameters==
The hybrid-pi model is a linearized [[two-port network]] approximation to the transistor using the small-signal base-emitter voltage <math>v_{be}</math> and collector-emitter voltage <math>v_{ce}</math> as independent variables, and the small-signal base current <math>i_{b}</math> and collector current <math>i_{c}</math> as dependent variables. (See Jaeger and Blalock.<ref name=Jaeger1>
The hybrid-pi model is a linearized [[two-port network]] approximation to the transistor using the small-signal base-emitter voltage <math>v_{be}</math> and collector-emitter voltage <math>v_{ce}</math> as independent variables, and the small-signal base current <math>i_{b}</math> and collector current <math>i_{c}</math> as dependent variables. (See Jaeger and Blalock.<ref name=Jaeger1/>
{{cite book
|author=R.C. Jaeger and T.N. Blalock
|title=Microelectronic Circuit Design
|year= 2004
|edition=Second Edition
|publisher=McGraw-Hill
|location=New York
|isbn=0-07-232099-0
|pages=Section 13.5, esp. Eqs. 13.19
|url=http://worldcat.org/isbn/0072320990}}
</ref>)
[[Image:H pi model.png|frame|Figure 1: Simplified, low-frequency hybrid-pi [[BJT]] model.]]
[[Image:H pi model.png|frame|Figure 1: Simplified, low-frequency hybrid-pi [[BJT]] model.]]
A basic, low-frequency hybrid-pi model for the [[bipolar transistor]] is shown in figure 1. The various parameters are as follows.
A basic, low-frequency hybrid-pi model for the [[bipolar transistor]] is shown in figure 1. The various parameters are as follows.


*<math>g_m = \frac{i_{c}}{v_{be}}\Bigg |_{v_{ce}=0} = \begin{matrix}\frac {I_\mathrm{C}}{ V_\mathrm{T} }\end{matrix} </math> is the [[transconductance]] in [[Siemens (unit)|siemens]], evaluated in a simple model (see Jaeger and Blalock<ref name=Jaeger>
*<math>g_m = \frac{i_{c}}{v_{be}}\Bigg |_{v_{ce}=0} = \begin{matrix}\frac {I_\mathrm{C}}{ V_\mathrm{T} }\end{matrix} </math> is the [[transconductance]] in [[Siemens (unit)|siemens]], evaluated in a simple model (see Jaeger and Blalock<ref name=Jaeger/>)
{{cite book
|author=R.C. Jaeger and T.N. Blalock
|title=Eq. 5.45 pp. 242 and Eq. 13.25 p. 682
|isbn=0-07-232099-0
|url=http://worldcat.org/isbn/0072320990}}
</ref>)
   
   
:where:
:where:
Line 48: Line 31:
*<math>g_m = \frac{i_{d}}{v_{gs}}\Bigg |_{v_{ds}=0}</math>  
*<math>g_m = \frac{i_{d}}{v_{gs}}\Bigg |_{v_{ds}=0}</math>  


is the [[transconductance]] in [[Siemens (unit)|siemens]], evaluated in the Shichman-Hodges model in terms of the [[Q-point]] drain current <math> I_D</math> by (see Jaeger and Blalock<ref name=Jaeger2>
is the [[transconductance]] in [[Siemens (unit)|siemens]], evaluated in the Shichman-Hodges model in terms of the [[Q-point]] drain current <math> I_D</math> by (see Jaeger and Blalock<ref name=Jaeger2/>):  
{{cite book
|author=R.C. Jaeger and T.N. Blalock
|title=Eq. 4.20 pp. 155 and Eq. 13.74 p. 702
|isbn=0-07-232099-0
|url=http://worldcat.org/isbn/0072320990}}
</ref>):  


:::<math>\ g_m = \begin{matrix}\frac {2I_\mathrm{D}}{ V_{\mathrm{GS}}-V_\mathrm{th} }\end{matrix}</math>,
:::<math>\ g_m = \begin{matrix}\frac {2I_\mathrm{D}}{ V_{\mathrm{GS}}-V_\mathrm{th} }\end{matrix}</math>,
Line 71: Line 48:
   
   
:::<math>r_O = \begin{matrix}\frac {1/\lambda+V_{DS}}{I_D}\end{matrix} \approx \begin{matrix} \frac {V_E L}{I_D}\end{matrix} </math>,
:::<math>r_O = \begin{matrix}\frac {1/\lambda+V_{DS}}{I_D}\end{matrix} \approx \begin{matrix} \frac {V_E L}{I_D}\end{matrix} </math>,
using the approximation for the '''channel length modulation''' parameter &lambda;<ref name=Sansen>
using the approximation for the '''channel length modulation''' parameter &lambda;<ref name=Sansen/>
:::<math> \lambda =\begin{matrix} \frac {1}{V_E L} \end{matrix} </math>.
Here ''V<sub>E</sub>'' is a technology related parameter (about 4 V / μm for the [[65 nanometer|65 nm]] technology node<ref name = Sansen/>)  and ''L'' is the length of the source-to-drain separation.
 
The reciprocal of the output resistance is named the '''drain conductance'''
*<math>g_{ds} = \frac {1} {r_O} </math>.
 
 
==References and notes==
 
{{reflist |refs=
<ref name=Jaeger1>
{{cite book
|author=R.C. Jaeger and T.N. Blalock
|title=Microelectronic Circuit Design
|year= 2004
|edition=Second Edition
|publisher=McGraw-Hill
|location=New York
|isbn=0-07-232099-0
|pages=Section 13.5, esp. Eqs. 13.19
|url=http://worldcat.org/isbn/0072320990}}
</ref>)
 
<ref name=Jaeger>
{{cite book
|author=R.C. Jaeger and T.N. Blalock
|title=Eq. 5.45 pp. 242 and Eq. 13.25 p. 682
|isbn=0-07-232099-0
|url=http://worldcat.org/isbn/0072320990}}
</ref>)
 
<ref name=Jaeger2>
{{cite book
|author=R.C. Jaeger and T.N. Blalock
|title=Eq. 4.20 pp. 155 and Eq. 13.74 p. 702
|isbn=0-07-232099-0
|url=http://worldcat.org/isbn/0072320990}}
</ref>
 
<ref name=Sansen>
{{cite book  
{{cite book  
|author=W. M. C. Sansen
|author=W. M. C. Sansen
Line 82: Line 99:
|url=http://worldcat.org/isbn/0387257462}}
|url=http://worldcat.org/isbn/0387257462}}
</ref>  
</ref>  
:::<math> \lambda =\begin{matrix} \frac {1}{V_E L} \end{matrix} </math>.
Here ''V<sub>E</sub>'' is a technology related parameter (about 4 V / μm for the [[65 nanometer|65 nm]] technology node<ref name = Sansen/>)  and ''L'' is the length of the source-to-drain separation.


The reciprocal of the output resistance is named the '''drain conductance'''
*<math>g_{ds} = \frac {1} {r_O} </math>.




==References and notes==


{{reflist}}
 
 
 
}}

Revision as of 12:42, 22 May 2011

The hybrid-pi model is a popular circuit model used for analyzing the small signal behavior of transistors. The model can be quite accurate for low-frequency circuits and can easily be adapted for higher frequency circuits with the addition of appropriate inter-electrode capacitances and other parasitic elements.

BJT parameters

The hybrid-pi model is a linearized two-port network approximation to the transistor using the small-signal base-emitter voltage and collector-emitter voltage as independent variables, and the small-signal base current and collector current as dependent variables. (See Jaeger and Blalock.[1]

Figure 1: Simplified, low-frequency hybrid-pi BJT model.

A basic, low-frequency hybrid-pi model for the bipolar transistor is shown in figure 1. The various parameters are as follows.

  • is the transconductance in siemens, evaluated in a simple model (see Jaeger and Blalock[2])
where:
  • is the quiescent collector current (also called the collector bias or DC collector current)
  • is the thermal voltage, calculated from Boltzmann's constant, the charge on an electron, and the transistor temperature in kelvins. At 300 K (approximately room temperature) is about 26 mV (Google calculator).
  • in ohms
where:
  • is the current gain at low frequencies (commonly called hFE). Here is the Q-point base current. This is a parameter specific to each transistor, and can be found on a datasheet; is a function of the choice of collector current.
  • is the output resistance due to the Early effect.

Related terms

The reciprocal of the output resistance is named the output conductance

  • .

The reciprocal of gm is called the intrinsic resistance

  • .

MOSFET parameters

Figure 2: Simplified, low-frequency hybrid-pi MOSFET model.

A basic, low-frequency hybrid-pi model for the MOSFET is shown in figure 2. The various parameters are as follows.

is the transconductance in siemens, evaluated in the Shichman-Hodges model in terms of the Q-point drain current by (see Jaeger and Blalock[3]):

,
where:
is the quiescent drain current (also called the drain bias or DC drain current)
= threshold voltage and = gate-to-source voltage.

The combination:

often is called the overdrive voltage.

  • is the output resistance due to channel length modulation, calculated using the Shichman-Hodges model as
,

using the approximation for the channel length modulation parameter λ[4]

.

Here VE is a technology related parameter (about 4 V / μm for the 65 nm technology node[4]) and L is the length of the source-to-drain separation.

The reciprocal of the output resistance is named the drain conductance

  • .


References and notes

  1. R.C. Jaeger and T.N. Blalock (2004). Microelectronic Circuit Design, Second Edition. New York: McGraw-Hill, Section 13.5, esp. Eqs. 13.19. ISBN 0-07-232099-0. 
  2. R.C. Jaeger and T.N. Blalock. Eq. 5.45 pp. 242 and Eq. 13.25 p. 682. ISBN 0-07-232099-0. 
  3. R.C. Jaeger and T.N. Blalock. Eq. 4.20 pp. 155 and Eq. 13.74 p. 702. ISBN 0-07-232099-0. 
  4. 4.0 4.1 W. M. C. Sansen (2006). Analog Design Essentials. Dordrechtμ: Springer. ISBN 0-387-25746-2.